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Magazine Name : Ieee Transactions On Electron Devices

Year : 1998 Volume number : 45 Issue: 04

The Relation Between Luminous Properties And Oxygen Content In Zns Tbof Thin-Film Electroluminescent Devices Fabricated By Radio-Frequency Magnetron Sputterng Method (Article)
Subject: Delts , Electroluminescence , Ftir , Zns
Author: C. W. Wang      J. Y. Liao      Meiso Yokoyama     
page:      757 - 762
High-Performance 670-Nm Algainp/Gainp Visible Strained Quanturm Well Lasers (Article)
Subject: Algainp , Beam , Semiconductor Lasers , Visible Human Slice Extraction
Author: Y.K Su      W Liang      C. -Y Tsai      C.S. Chang     
page:      763 - 767
Simulation And Measurement Of Multiplication In Thin-Film Electroluminescent Devices With Doped Probe Layers (Article)
Subject: Displays , Electroluminescence , Multiobjective , Space Cadets
Author: Kristiaan Neyts      Dorina Corlatan     
page:      768 - 777
Development Of A Novel Image Intensifier Of An Amplified Metal-Oxide-Semiconductor Imager Overlaid With Electron-Bombarded Amorphous Silicon (Article)
Subject: Ami , Amorphous Silicon , Eb Gain , Mcpherson County
Author: Fumihiko Andoh      Mitsuo Kosugi      Tatsuro Kawamura     
page:      778 - 784
Characterization Of Highly Doped N-And P-Type 6h-Sic Piezoresistors (Article)
Subject: High Density , Characterization
Author: Robert S. Okojie      Alexander A. Ned      William N. Carr     
page:      785 - 790
Theory Of Sige Waveguide Avalanche Detectors Operating At 1.3 (Article)
Subject: Avalanche Photodiodes , Multi Fifo Queues , Optical Fibers
Author: D. C. Herbert     
page:      791 - 796
An Analytical Fully-Depleted Soi Mosfet Model Considering The Effects Of Self-Heating And Source /Drain Resistance (Article)
Subject: Self-Healing , Series Resistance Effect , Soi Mosfet
Author: Man-Chun Hu      Sheng Lyang Jang     
page:      797 - 801
Verifiction Of Electron Distribution In Silicon By Means Of Hot Carrier Luminescence Measurements (Article)
Subject: Distribution Function , Hot Carrier , Luminescence
Author: Luca Selmi      M Mastrapasqua      J Bude     
page:      802 - 808
A 0.1 Delta-Doped Mosfet Fabricated With Post-Low-Energy Implanting Selective Epitaxy (Article)
Subject: Epitaxial Growth Floating-Body Effect , Silicon , Mosfet
Author: Kenji Noda      Toru Tatsumi      Ken Nakajima     
page:      809 - 814
Planarized Multilevel Interconnection Using Chemical Mechanical Polishing Of Selective Cvd-Ai Via Plugs (Article)
Subject: Aluminum Integrated Circuit Conductors , Electromigration , Cmp
Author: Takao Amazawa      Yoshinobu Arita      Eiichi Yamamoto     
page:      815 - 820
A Continuous Compact Mosfet Model For Fully-And Partially-Depleted Soi Devices (Article)
Subject: Fda , Pd , Soi
Author: Jeffrey W. Sleight      Rafael Rios     
page:      821 - 825
Dynamic Modeling Of Amorphous And Polycrystalline-Silicon Devices (Article)
Subject: Amorphous , Gap States , Time-Dependent Pricing
Author: Luigi Colalongo      Marina Valdinoci      Aurelio Pellegrini     
page:      826 - 833
A Robust And Physical Bsim3 Non-Quasi-Static Transient And Ac Small-Signal Model For Circuit Simulation (Article)
Subject: Robust , Physical Based , Model Choice
Author: Mansun Chan      Kelvin Y. Hui      Ping K. Ko     
page:      834 - 841
Two-Dimensional Numerical Simulation Of Schottky Barrier Mosfet With Channel Length To 10nm (Article)
Subject: Mosfets , Scaling , Ultrasonic
Author: Changcheng Huang      Wei Zhang      C. H Yang     
page:      842 - 848
Lateral Scr Devices With Low-Voltage High-Current Triggering Characteristics For Output Esd Protection In Submicron Cmos Technology (Article)
Subject: Lateral Schottky , High-Capacitance Busses , Cmos
Author: Ming-Dou Ker     
page:      849 - 860
The Impact Of Metal-1 Plasma Processing Induced Hot Carrier Injection On Thecharacteristics And Reliability Of N-Mosfet'S (Article)
Subject: Impact Analysis , Carroer-Sense Multiple Access , Reliability
Author: Motasim G. Ei Hassan      Osama O. Awadelkarim      James D. Werking     
page:      861 - 866
Analysis Of Quantum Effects In Nonuniformly Doped Mos Structures (Article)
Subject: Mos , Devices , Quantization , Silicon
Author: Claudio Fiegna      Antonio Abramo     
page:      877 - 880
Trapped Charge Distributions In Thin (10nm) Sio2 Films Subected To Static And Dynamic Stresses (Article)
Subject: Charge Carrier Processes , Dielectric Breakdown , Oxide Degradation
Author: R. Rodriguez      M. Nafria      X. Aymerich     
page:      881 - 888
Cmos Active Pixel Pixel Image Sensors Fabricated Using A 1.8-V, 0.25- Cmos Technology (Article)
Subject: Cmos , Pixel Wise , Sensors
Author: Hon-Sum Philip Wong      Richcrd T. Chang      Paul D. Agnello     
page:      889 - 894
A Comparison Of Hot-Carrier Degradation In Tungsten Polycide Gate And Poly Gate P-Mosfet'S (Article)
Subject: Gate-To-Drain Capacitance , Hot-Carrier Degradation , Tungsten Polycide
Author: D. S. Ang      C. H. Ling     
page:      895 - 903
New Insights In The Relation Relatio Between Electron Trap Generation And The Statistical Properties Of Oxide Breakdown (Article)
Subject: Relation Extraction , Properties , Statistical
Author: Robin Degraeve      G. Groeseneken      J. L. Ogier      Herman E Maes     
page:      904 - 911
Characterization Of Polysilicon Oxides Thermally Grown And Deposited On The Polished Polysilicon Films (Article)
Subject: Characterisation , Oxidants , Polysilicon
Author: Tan Fu Lei      Shyh Yin Shiau      Chao Sung Lai     
page:      912 - 917
A Multicomb Variance Reduction Scheme For Monte Carlo Semiconductor Simulators (Article)
Subject: Importance Sampling , Monte Carlo , Variance Reduction
Author: Mark G. Gray      Thomas E. Booth      Charles M. Smell     
page:      918 - 924
High-Performance Thin-Film Transistors Fabricated Using Excimer Laser Processing And Grain Engineering (Article)
Subject: Excimer Laser Annealing , Floating Body Effects , Full Melt Threshold
Author: G. K. Giust      T. W. Sigmon     
page:      925 - 932
Suppressing The Parasitic Bipolar Action In Fully-Depleted Mosfet''S/Simox By Using Back-Side Bias-Temperature Treatment (Article)
Subject: Bias-Temperature , Fully-Depleted Soi Mosfet , Simox
Author: H Koizumi      Toshiaki Tsuchiya      Maskazu Shimaya     
page:      933 - 938
Assessing The Reliability Of Silicon Nitride Capacitors In A Gaas Ic Process (Article)
Subject: Dielectric Breakdown , Reliability Estimation , Reliability Modeling
Author: Bob Yeats     
page:      939 - 946
Analysis On Accuracy Of Charge-Pumping Measurement With Gate Sawtooth Pluses (Article)
Subject: Charge Carrier Density , Mosfets , Silicon Avalanche Photodiode
Author: P. T. Lai      J. P. Xu      Y C Cheng     
page:      947 - 952
A Highly Efficient 1.9-Ghz Si High-Power Mos Amplifier (Article)
Subject: Al-Shorted Metal-Silicide Si Gate , Amplifier , Pcs Testing , Si
Author: Isao Yoshida      Mineo Katsueda      Yasuo Maruyama     
page:      953 - 956
A Mos-Controlled High-Voltage Thyristor With Low Swithin Losses (Article)
Subject: Mos-Controlled Thyristor , Semiconductor Devices , Thyristor Bridge
Author: Willy Hermansson      Karin Andersson      Dag Sigurd     
page:      957 - 965
Accurate Cold-Test Model Of Helical Twt Slow-Wave Circuits (Article)
Subject: Attenuators , Dispersion , Helix , Impedance
Author: Carol L. Kory      James A. Dayton     
page:      966 - 971
Effect Of Helical Slow-Wave Circuit Variations On Twt Cold-Test Characteristics (Article)
Subject: Dispersion , Helix , Impedance , Manufactureing
Author: Carol L. Kory      James A. Dayton     
page:      972 - 976
Technology And Charcterization Of Diamond Field Emitter Sttuctures (Article)
Subject: Cvd , Diamond Materials , Electron Emission
Author: D. Hong      M. Aslam     
page:      977 - 985
Design Of A Single-Stage Depressed Collector For High-Power, Pulsed Gyroklystron Amplifiers (Article)
Subject: Depressed Collector , Microwave Sources , Gyroklystron Amplifier
Author: Girish P. Saraph      Victor L Granatstein      S. S Lawson     
page:      986 - 990